2606B源測(cè)量單元

2606B 系統(tǒng)源表源測(cè)量單元(SMU) 儀器在一個(gè)外形1U 高的機(jī)箱中集成了四個(gè)20W SMU 通道。2606B 基于 吉時(shí)利第三代SMU 技術(shù)，在一臺(tái)緊密集成的儀器中， 同時(shí)融合了精密電源、真實(shí)電流源、6 位半DMM、任 意波形發(fā)生器和脈沖發(fā)生器的功能。其提供了強(qiáng)大的 解決方案，明顯提升了測(cè)試效率，可以滿(mǎn)足苛刻的光 電器件自動(dòng)檢定和生產(chǎn)測(cè)試需求，比如3D 傳感和光通 信中使用的VCSEL/ 激光二極管、消費(fèi)品和汽車(chē)中使用 的LED 以及模擬IC、ASIC 和片上系統(tǒng)(SOC) 器件等 集成器件。在要求高SMU 通道數(shù)時(shí)，多臺(tái)2606B 儀 器可以相互堆疊，在儀器之間不需要散熱空間?；?網(wǎng)絡(luò)瀏覽器的內(nèi)置軟件可以通過(guò)任何電腦，從世界上 任何地方與2606B 通信。對(duì)自動(dòng)系統(tǒng)應(yīng)用，2606B 的 測(cè)試腳本處理器(TSP®) 技術(shù)從儀器內(nèi)部運(yùn)行整個(gè)測(cè)試 程序，實(shí)現(xiàn)業(yè)內(nèi)吞吐量。在大型多通道應(yīng)用中， 吉時(shí)利的TSP-Link® 技術(shù)與TSP 技術(shù)相結(jié)合，實(shí)現(xiàn)了 高速SMU-per-pin 并行測(cè)試。在使用于新應(yīng)用時(shí)， 每臺(tái)2606B SMU 的代碼都能兼容行業(yè)的Keithley 2602B 系統(tǒng)源表SMU 儀器。

主要特點(diǎn):

• 在一個(gè) 1U全機(jī)架機(jī)箱中實(shí)現(xiàn) 4 通道 SMU 儀器

• 可堆疊，儀器之間沒(méi)有 1U間隔要求

• 緊密集成的電壓/電流源和測(cè)量?jī)x器，6位半分辨率，提供同類(lèi)的性能

• 20 V @ 1 A 和 6 V @ 3 A 功率包絡(luò)，20 W

• 0.015% DCV基本準(zhǔn)確度

• 高達(dá) 28個(gè)開(kāi)路漏極數(shù)字 I/O 口

• 測(cè)試結(jié)果與 2602B系統(tǒng)源表 SMU 儀器一致

• TSP 技術(shù)把整個(gè)測(cè)試程序嵌入儀器內(nèi)部，實(shí)現(xiàn)了同類(lèi)的系統(tǒng)級(jí)吞吐量

• TSP-Link擴(kuò)展技術(shù)，實(shí)現(xiàn)多通道并行測(cè)試，無(wú)需主機(jī)

• 前面板LAN (LXI-C)、USB 2.0 TMC488協(xié)議和數(shù)字I/O 接口

• 基于網(wǎng)絡(luò)瀏覽器的內(nèi)置軟件，通過(guò)任何瀏覽器，從世界上任何地方任何電腦實(shí)現(xiàn)遠(yuǎn)程控制

The 2606B system source-meter source-measurement unit (SMU) instrument is integrated with four 20W SMU channels in a 1u-high chassis. The 2606B is based on the GST third-generation SMU technology and is integrated in a tightly integrated instrument with the functions of precision power supply, real current source, 6-bit half-dmm, arbitrary waveform generator and pulse generator. It provides powerful solutions that significantly improve test efficiency and meet demanding requirements for automatic verification and production testing of optoelectronic components, such as VCSEL/ laser diodes for 3D sensing and optical communications, leds for consumer products and autos, and integrated devices such as analog IC, ASIC, and on-chip systems (SOC) devices. When the number of SMU channels is high, multiple 2606B meters can be stacked on top of each other and no heat dissipation space is required between the instruments. The built-in software based on the web browser can communicate with 2606B from any computer in the world. Application of automatic system, the 2606 b test scripts processor (TSP ®) run the entire test program from inside the instrument technology, the best throughput to achieve the industry. In large multi-channel application, keithley TSP ® cc-link technology combined with the TSP technology, realized the high-speed SMU - per - pin parallel test. Each 2606B SMU code is compatible with industry-leading Keithley 2602B system source list SMU instruments for use in new applications.

Main features:

Implement 4 channel SMU instrumentation in a 1U full rack chassis

Stackable, no 1U interval between instruments required

Tightly integrated voltage/current source and measuring instrument, 6 bit half resolution, providing best performance of its kind

20v@1a and 6v@3a power envelope, 20w

0.015% DCV basic accuracy

Up to 28 open drain digital I/O ports

The test results are consistent with the SMU instrument of the system source meter 2602B

TSP technology embedded the whole test program into the instrument to achieve the best system level throughput of the same kind

TSP-Link extension technology, multi - channel parallel testing, no host

Front panel LAN (lxi-c), USB 2.0 TMC488 protocol and digital I/O interface

Web browser-based built-in software that enables remote control from any computer anywhere in the world via any browser