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詳細(xì)介紹
特點(diǎn) | 優(yōu)勢(shì) |
| 主動(dòng)溫度控制 | 防止溫度變化可能引起激光二極管主輸出波長(zhǎng)發(fā)生變化，導(dǎo)致出現(xiàn)信號(hào)重疊和串?dāng)_問題。 |
| 50W TEC 控制器 | 比其他低功耗解決方案提供更高的測(cè)試速度和更寬的溫度設(shè)定值范圍。 |
| 全數(shù)字 P-I-D 控制 | 提供更高的溫度穩(wěn)定性，并可通過簡(jiǎn)單的固件變化輕松升級(jí)。 |
| 適用于熱控制環(huán)路的自動(dòng)調(diào)諧功能 (2510-AT) | 無需反復(fù)試驗(yàn)即可確定 P、I 和 D 系數(shù)的組合。 |
| 寬溫度設(shè)定值范圍（–50°C 至 +225°C）以及高設(shè)定值分辨率 (±0.001°C) 和穩(wěn)定性 (±0.005°C) | 能夠滿足大部分冷卻光學(xué)元器件和子裝配件生產(chǎn)測(cè)試的測(cè)試要求。 |
| 兼容于多種溫度傳感器輸入 — 熱敏電阻、RTD 和 IC 傳感器 | 適合于各類激光二極管模塊的溫度傳感器類型。 |
| 交流歐姆測(cè)量功能 | 驗(yàn)證 TEC 器件的完整性。 |
| 適用于熱反饋元件的四線開路/短路引線檢測(cè) | 消除引線電阻測(cè)量值誤差，減少假故障或設(shè)備損壞的可能性。 |
型號(hào)
| 型號(hào) | 通道 | 電流源/量程 | 電壓源/量程 | 電源 | 測(cè)量分辨率（電流/電壓） |
|---|---|---|---|---|---|
| 2510 | 1 | 5A | 10V | 50 W | - |
| 2510-AT | 1 | 5A | 10V | 50 W | - |
| 2502 | 2 | 20mA | 100V | 2 W | 1fA |
| 2520 | 1 | 5A | 10V | 50 W | 700nA / 0.33mV |
The 2510 and 2520-AT precision temperature source meters enhance the integrity of the high speed Liv (light intensity current-voltage) measurement of laser diodes. The two 50W power bipolar source meter instruments, designed specifically for the testing applications of laser diode modules in optical communication networks, are designed to ensure strict temperature control of the devices being tested.The 2510 is the first dedicated temperature control instrument to be used for laser diode testing in optical communications, bringing together the high-speed DC power supply and precision measurement capabilities of Kishli The ability to control the precise temperature of the thermoelectric cooler (TEC) of the laser diode module is formed.
The main features of the 2510-AT automatic temperature control (2510-AT) source table in the United States of America are as follows:
Control and production testing of thermoelectric coolers (Peltier devices), including:
Laser diode module;
Ir charge coupled device (CCD) array and charge injection device (CID);
Cooling photodetector;
Thermo-optical switch;
Temperature control fixture;
The main applications of 2510-AT automatic temperature Control (2510-AT) Source Table in America:
For production testing of the following devices:
Remote communication laser diode;
Optical storage read / write head laser diode;
Vertical cavity surface emitting laser (VCSELL);
Thermal impedance;
Junction temperature response
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