主要特性與技術(shù)指標(biāo)
支持多頻率交流阻抗測量，適用于 CV（電容 – 電壓）、C-t（電容 – 時(shí)間）和 C-f（電容 – 頻率）測量
頻率范圍是 1 kHz 至 5 MHz，頻率分辨率是 1 mHz
SMU 和 SCUU（SMU CMU 統(tǒng)一單元）提供 25 V 內(nèi)置直流偏置和 100 V 直流偏置
SCUU 支持自動(dòng)更改連接，以進(jìn)行快速、精確的 IV 和 CV 測量
信號電平高達(dá) 250 mVrms
在 CV、C-f 和 C-t 測量中有 1001 個(gè)掃描點(diǎn)
支持的測量：Cp-G、Cp-D、Cp-Q、Cp-Rs、Cs-Rs、Cs-D、Cs-Q、Lp-G、Lp-D、Lp-Q、Lp-Rs、Ls-Rs、Ls-D、Ls-Q、R-X、G-B、Z-θ、Y-θ
描述
通過集成電流-電壓（IV）和 CV 測量，可讓您對電容-電壓（CV）測量結(jié)果充滿信心
Keysight B1500A 系列中的 Keysight B1520A 多頻率電容測量單元（MFCMU）擁有是德多年以來的 LCR 儀表技術(shù)和知識作為后盾。它將會進(jìn)一步擴(kuò)展 Keysight B1500A 半導(dǎo)體器件分析儀的精確電容測量功能。Keysight B1500A 集成了 MFCMU 和電源/測量單元（SMU）的功能，能夠執(zhí)行基本的 IV 測量和多種電容測量，例如 CV、C-t、C-f 和準(zhǔn)靜態(tài) CV（QS-CV），因而是一款綜合的 IV 和 CV 測量解決方案。對于要求進(jìn)行精密 IV 和 CV 測量的半導(dǎo)體、碳納米管（CNT）、碳納米
Main features and technical indicators
Supports multi-frequency ac impedance measurements for CV (capacitance - voltage), c-t (capacitance - time) and c-f (capacitance - frequency) measurements
The frequency range is 1 kHz to 5 MHz, and the minimum frequency resolution is 1 MHz
The SMU and the SCUU (unified unit of the SMU CMU) provide 25 V built-in dc offset and 100 V dc offset
SCUU supports automatic connection changes for quick and accurate IV and CV measurements
The signal level is up to 250 mVrms
There are 1001 scanning points in the CV, c-f and c-t measurements
Measurements supported: cp-g, cp-d, cp-q, cp-rs, cs-rs, cs-d, cs-q, lp-g, lp-d, lp-q, lp-rs, ls-rs, ls-d, ls-q, ls-x, rs-x, g-b, z-r, y-r
describe
The integrated current-voltage (IV) and CV measurements give you confidence in the capacitance voltage (CV) measurements
The Keysight B1520A multi-frequency capacitance measuring unit (MFCMU) in the Keysight B1500A series is backed by years of LCR instrumentation technology and knowledge. It will further extend the precision capacitance measurement capabilities of the Keysight B1500A semiconductor device analyzer. Keysight B1500A integrates MFCMU and power/measurement unit (SMU) functions to perform basic IV measurements and a variety of capacitance measurements such as CV, c-t, c-f, and quasi-static CV (qs-cv) and is therefore a comprehensive IV and CV measurement solution. For semiconductors, carbon nanotubes (CNTS), and carbon nanometers requiring precise IV and CV measurements
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